Abstract How to Cite Metrics ... Section How to Cite Pham, V. P. . (2018). Layer-by-Layer Thinning of 2D Materials. Edelweiss Applied Science and Technology, 2(1), 36–37. https://doi.org/10.33805/2576.8484.111 More Citation Formats ACM APA Chicago MLA Download Citation Endnote/Zotero/Mendeley (RIS) BibTeX Downloads Download data is not yet available. Dimension Badge Download Downloads PDF Issue Vol. 2 No. 1 (2018) Section Articles Published 2018-01-19